Multitest MiCon® Contactor: Advantages of Cantilever Design for MCU and ASIC Testing

Significant Improvements in Overall Equipment Efficiency (OEE)

Multitest recently launched the MiCon contactor. The MiCon leverages the industry-proven Cantilever technology for the final test of Microcontrollers, Industrial DSPs and Application Specific ICs. Evaluations at customer test floors showed substantial improvements in first pass yield, life span and cleaning cycles compared to spring pin solutions. MiCon fully supports the requirements of a high, stable and reliable production output at lowest cost of test.

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Multitest Atlas Contactor Demonstrates Advanced Electrical and Mechanical Performance in WLCSP Testing

Atlas 0.3 mm pitch spring probe validated at customer site

Multitest’s new 0.3 mm pitch Atlas contactor successfully passed a demanding customer production floor evaluation. The customer’s evaluation measures confirmed that the Atlas did reduce the customer’s cost of test while improving test yield and increasing throughput. Based on the evaluation results, the customer ordered a significant number of Atlas 030 contactors to support their new product WLCSP production ramp.

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ECT High Current Probes Leverage over 50 Years of Industry Leading Experience

A comprehensive high current product portfolio provides both technical and commercial advantages to the customer

ECT high current probes are an optimal choice for testing PCBAs and electronic assemblies as well as embedded OEM applications. With multiple options ranging from 10 A up to 150 A DC, ECT offers cost-effective and highly reliable solutions to address the major technical challenges facing high current probes: consistent high current carrying capacity and low heat dissipation.

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