Everett Charles Technologies to exhibit at AmCon Expo 2016

Leading Connector and Probe Solutions Meeting the Requirements of Challenging Applications

Everett Charles Technologies (ECT) will exhibit its leading Electronic Interconnect Solutions at the upcoming AmCon Expo taking place September 21 – 22 at the Rochester Riverside Convention Center, NY.

ECT offers a comprehensive portfolio of compliant connectors including customized solutions. ECT’s standard connectors are based on a highly flexible architecture, which facilitates cost-efficient configurations for customer requirements. ECT compliant connectors meet the highest quality standards and have proven superior durability in high life cycle applications. Leveraging decades of experience and a US-based manufacturing, ECT uses application specific materials and contact technology to ensure reliable signal integrity. ECT’s Compliant Connectors feature sealed connections and are also available for high current and high frequency applications.

ECT will also feature its line of battery probes at the AmCon Expo. ECT battery probes are used in a wide range of applications that include docking stations, data transmission, PCB interposers, and contacts for connector assemblies for medical, mil/aero, transportation and more. ECT battery probes maintain consistent electro-mechanical characteristics in excess of mission cycles. ECT’s versatile line of battery interconnect probes provides design flexibility to match performance, cost, and assembly requirements. In addition, these products can be modified or custom designed to meet specific project requirements.

For more information, please visit http://ect-cpg.com/compliant-connectors or http://ect-cpg.com/battery-probes


InGyro Test Cell Solution Supports MEMS Test for the Chinese Market

Xcerra and Spirox collaborate to provide advanced technology to support the China MEMS market with the new tri-temp gyroscope test cell

Xcerra has shipped the first complete fully tri-temp capable MEMS test cell for gyroscope test and calibration to SITRI, the Shanghai Industrial µTechnology Research Institute. The complete test cell solution includes an LTX-Credence Diamondx tester, Multitest InStrip handler, the Multitest InGyro sensor test module and a functional test program. The system is the first shipment of the new InGyro module to support testing at temperatures from -40°C to +125°C. Spirox Corporation, Xcerra’s business partner in Taiwan and China, worked closely with SITRI to define this new solution, which supports the MEMS growth strategy of the Chines government.

The InGyro module for physical stimulation of inertial sensors under temperature conditions supports multiple target applications: accelerometers, gyroscopes, as well as multi-axis IMU’s (inertial measurement units) up to 9DOF (Degrees of Freedom). To meet the requirements of automotive and other demanding applications the temperature range of the InGyro has been expanded to the range of -40°C to +125°C.

The new InGyro expands Multitest’s family of inertial test modules. The modular InGyro Test Call can be reconfigured for multiple sensor types and will also be used for accelerometer test. It combines high stimulus and temperature accuracy for engineering characterization and development with high parallelism for volume production.

Within the range of applications the ACE probe are compatible with all device types, platings, and pitches; and all test applications, including singulated devices, strip test and wafer-scale test. The ACE contactor supports pitches down to 0.4 mm.

Charles Yang, President of SITRI explains: “We consider MEMS and sensors the main source of value in IoT systems. They add the capability that gives “things” the ability to sense and respond to the environment. Therefore MEMS/sensors is one of our areas of focus. We offer a full range of production and research capabilities and the new Xcerra MEMS Test Cell expands our capabilities into characterization and production test.”

Peter Cockburn, Senior Product Manager, Test Cell Innovation, comments, “By combining Spirox’s comprehensive knowledge of the Chinese market, and their expertise in MEMS applications support with equipment from Multitest and LTX-Credence, we were able to develop this high-volume production test TCI solution. The modular and highly flexible test call allows SITRI to reconfigure the set-up easily to meet the requirements of future applications”.

To learn more about the Xcerra Test Cell Innovation, please click here

Multitest Triton 080 Contactor: New Tip for Significant OEE Improvements

Multitest recently introduced a new version of the well-established high performance Triton contactor. The new TRN080 delivers reduced cleaning needs, which directly contribute to higher test cell availability and better Overall Equipment Efficiency (OEE).

The Triton is the ideal high performance probe for general purpose and digital applications that demand high bandwidth contactor performance. Triton meets the requirements of the new generation of densely packaged large I/O count semiconductors for a high level of electrical and mechanical performance that is often unattainable with traditional spring probe test sockets. The next generation Triton 080 deploys a monolithic alloy probe tip that is less likely to bond with device lead/ball plating alloys. The lack of solder bonding to probe tip means reduced solder build up on probe tips leading to longer run times between cleaning.

Bert Brost, Product Managers, explains: “Multitest leverages years of experience in flat probe technology and innovation in the development of spring probe components for increasing the customer′s OEE in backend test. The new Triton 080 is a perfect example how we continue to analyze the changing market requirements to offer leading products to our customers.”

Everett Charles Technologies Non Magnetic

Probes for Reliable Sensor Testing with Full Temperature Range

Everett Charles Technologies (ECT) expands its product portfolio with non-magnetic spring probes for test applications, which are based on the measurement of the earth′s magnetic field in the full ambient/hot/cold temperature range. ECT non-magnetic probes ensure accurate, reliable and repeatable measurement of the earth′s magnetic field and the yaw rate movement in any of the three axes without interference from the test probes.

ECT′s non-magnetic probes support typical navigation applications in smart phones or dedicated navigation devices for cars in the fast growing MEMS/sensor market. For the development of these probes ECT not only drew upon its long-term experience in spring probes and materials, but also the comprehensive expertise within Xcerra in MEMS/sensor testing. By combining these elements ECT is able to provide non-magnetic spring probes that meet the challenging requirements of tri-temp MEMS/sensor testing. Sensors that measure the earth′s magnetic field and the yaw rate movement must be tested in a benign environment. To test sensors reliably without interference from the test stimulus, any possible materials that might disturb the earth′s magnetic field are not allowed in the area around the device under test. In addition, since many applications are bound for the automotive market, the test probes need to withstand temperature of -55°C up to +85°C and in some cases up to 150°C.

Tony DeRosa, Product Manager, explains: “By leveraging off of the vast sensor test experience within Xcerra, we are able to develop non-magnetic spring probe solutions with extraordinary performance in an unmatched temperature range. Our non-magnetic probes have been already deployed in volume production, where the outstanding performance has been confirmed.”

To learn more about the ECT non-magnetic spring probes, visit http://ect-cpg.com/non-magnetic-probes