Multitest Expands Contactor Portfolio for WLP / WLCSP Testing:

Mercury 030 combines best mechanical and electrical performance with ease of use and cost advantages 

Multitest’s Mercury 030 probe meets the increasing demand for cost-efficient high performance WLP / WLCSP contacting solutions. The Mercury 030 is designed to address the electrical requirements of today’s test challenges, without sacrificing mechanical performance in an automated test environment. The Mercury 030 is a WLCSP fine pitch probe made using a Multitest proprietary process that produces a long life, high strength probe with gold plating. For high reliability, stability, and very low contact resistance contacting, the Mercury 030 has two flat surfaces moving in surface-to-surface contact.

While electrical and cost benefits are turning WLP and WLCSP into the “go-to” packaging of choice, traditional wafer probe technology can prevent customers from testing the device in a WLP package to published specification. The low RLC parasitics of the Mercury 030 make it a preferred contacting solution for customers who want to fully test wafer level packaged devices in the DC, functional, and AC parametric domains.

The Mercury 030 probe geometry and components provide high bandpass (8 GHz @-1 dB insertion loss) and low resistance (160 mΩ). The Mercury 030 ensures required probing coplanarity matching the vertical heights of the customers’ WLCSP balls and/or lands. With a 0.33 mm window of compliance and low insertion force, the Mercury 030 is well qualified for both singulated and multisite WLP and WLCSP contacting and/or probing.

During customer field tests, the Mercury 030 demonstrated long run times between cleaning with an average probe replacement life of 300K -500K device contacts.

Particularly valued in a high volume environment, the Mercury 030 is easy to setup and to maintain.

Bert Brost, Product Manager at Xcerra’s Interface Product Group explains: “Although the Mercury 030 can cost less than traditional probe technology, its ease of use, ease of maintenance, and high performance attributes directly address customer test requirements. With this new contacting solution we are supporting our customers’ efforts to reduce costs and improve throughput. The Mercury 030 is the result of Multitest spring probe development experience, integrating proven technology that is of greater value to the customer than products offered by the competition.”

To learn more about the Multitest Mercury family, please visit www.multitest.com/Mercury

 

atg Luther & Maelzer Launches New Solution for Large, High Density PCBs:

LM2010 Grid Tester with Optical Alignment

atg Luther & Maelzer’s unique solution for testing large PCB panels with pads down to 150 microns ensures best yield in high volume production. The atg Luther & Maelzer LM2010 with optical alignment combines a well-established grid test system with the state-of-the-art Sniper optical alignment option.

Testing of products with 100-150 micron pads without optical alignment is negatively impacting yields. Pass rates can fall to 50-60% depending on the panel quality. Additionally, the risk of damaging the pads during test increases with smaller pad sizes. While grid test systems designed for testing HDI smartphone PCBs are capable of testing such dense structures, large panel testers do not have the same capability.

The new atg Luther & Melzer Sniper solution with optical alignment is specifically designed for large PCB – like MB motherboards – with dense structures. atg Luther & Maelzer adds the field proven Pico Sniper technology to the LM2010 providing the ability to test panels of up to – 19.2”.

Swen Fleischer, Vice President Greater China at atg-Luther & Maelzer explains: “We developed this solution in close cooperation with our main customers in Asia. It was driven by the trend of motherboard PCB manufacturers to produce two MB motherboards in one production panel. These productions panels with such a dense structure are similar to smartphones or tablet PCBs but with significantly larger dimensions making them more difficult to test. The low first pass rate of standard Grid testers for these types of applications adds cost due to multiple re-testing or the rejection of good PCBs. The LM2010 with Sniper solution can increase the first pass rate of these critical MB panels up to 85% to 95%!”.