Meeting the Challenges of Cost-Efficient Testing High-End Digital Devices

Everett Charles Technologies introduces new member of the ZIP probes family: Z-080YHJ

Everett Charles Technologies (ECT) launched a new member of the versatile ZIP™ semiconductor test probe family. The Z-080YHJ is designed to meet the many challenges associated with testing High End Digital (HED) devices. ZIP probes are a cost effective solution that provide excellent mechanical reliability and electrical performance.

Tony DeRosa, Senior Product Manager points out: “High lead count packages require a large compression window to compensate for package co-planarity stack-up errors. In addition, these devices often require a high level of signal integrity which is typically in the 12GHz+ range. These requirements result in conflicting physical parameters. A large compression window increases the length of the probe while high bandwidth drives probe length to as short as possible.”

The Z-080YHJ’s 5.0mm test height provides a generous total compression window of 0.8mm. The probe also provides an insertion loss of 18GHz @ -1dB (GSG). These factors combined make Z-080YHJ a perfect solution for HED applications. The Z-080YHJ is scaled for 0.8mm and greater device pitches and targets high lead count BGA’s and LGA’s. The DUT side plunger is made from ECT’s durable HyperCore™ homogenous alloy. This along with its sharp dual tip geometry allows penetration of solder ball oxides with less force than standard 4-point crown tips.

ZIP probes are based on ECT’s patented, innovative flat probe technology. The manufacturing process used to fabricate ZIP probes is extremely repeatable and results in a high level of consistency from probe lot to lot. Other ZIP probes target RF, mixed signal and general purpose semiconductor test applications. Markets served include burn-in, lab testing and high volume production. Low cost and high performance are hallmarks of ZIP probes.”

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Bringing MEMS Testing to the Next Level

Installation of first complete Xcerra turn key test cell for MEMS in Asia

Xcerra finalized the installation of a complete test cell for 3/6DOF inertial and navigation MEMS applications at an Asian customer. The test cell leverages proven Xcerra expertise in highly parallel test of sensor devices, delivered through the LTX-Credence and Multitest semiconductor test brands. The customer benefits from the pre-validated test cell set-up, with integrated test program and optimization support, to rapidly realize outstanding test efficiency and target yield performance.
The Xcerra MEMS test cell ideally combines the cost of test advantages of highly-parallel, high-throughput testing with the flexibility of the scalable base equipment. The Multitest InStrip handler with the exchangeable InFlipM MEMS stimulus and interface options and high-density Mercury contactors is combined with the Diamondx tester using DPIN96 digital pins; this combination supports the fast test and calibration of 3DOF magnetometers at 204 sites in parallel on strip, as well as 2/3DOF accelerometers at 216 sites in parallel, using the Multitest InCarrier solution for wafer level package test at about 1.5×1.5 mm device size. Changing between the applications requires less than 30 minutes to swap the test interfaces, the handler conversion kit and the test program.

Peter Cockburn, Senior Product Manager Test Cell Innovation, explains: “The project was driven by an Asian fabless customer, who searched for a highly parallel test solution at an OSAT to support the aggressive production ramp and cost of test reduction goals for his mobility MEMS applications. With the Xcerra Test Cell Solution, the fabless customer is now able to outsource his test in a highly efficient way. In addition, the OSAT can fully leverage the flexibility of the Xcerra Test Cell Solution for further business opportunities.”

To learn more about the Xcerra Test Cell Innovation, please visit www.Xcerra.com/TCI

 

High Current meets Strip Test: Multitest launches HC Contactor for high parallel test

Multitest announces that its new high power Kelvin contactor for strip test successfully passed a long term evaluation for a high volume automotive application at an Asian manufacturing site of a global IDM. The outstanding yield and contactor pin lifespan enable extraordinary OEE (overall equipment efficiency) and a lower overall cost of test.

The evaluation ran for over a year using a SO150 package for a high current automotive application requiring very high volumes. The results proved the outstanding performance of this contacting solution: >99% first pass yield and a contact pin life span of more than 1 million insertions.

The Multitest High Current Strip Contactor addresses two critical requirements: high power carrying capability and the limited space in a high parallel test set up. Usually, strip contactors are based on vertical probe designs, which cannot meet the electrical and thermal requirements of high current applications. The new contactor is based on the established Multitest ecoAmp Cantilever design and deliveries superior electrical performance and temperature accuracy.

For more information about Multitest’s ecoAmp™ contactors, visit  www.multitest.com/ecoAmp 

Enabling Test for High Voltage Applications

MT9510 pick and place handler for testing up to 10 kV

Rosenheim (Germany), August 2015: Multitest has shipped the first MT9510 pick and place handler for testing high voltage applications up to 10 kV (peak). A complete solution can be provided through Multitest’s Plug & Yield program which includes a Multitest high power contactor. The entire set up has been optimized to meet the challenges of cost-efficient and reliable high voltage testing.

The Multitest high voltage solution will be deployed for the automotive market (hybrid cars) andfor consumer market applications.

The Multitest MT9510,a kitable tri-temp pick and place handler, is established as the benchmark test handler in the automotive market due to its superior temperature performance in the full ambient/hot/cold range and the broad variety of additional optional features.

The high voltage set up uses a standard MT9510 base unit. All application specific requirements are covered with the design of the dedicated high voltage conversion kit. This way the greatest flexibility at the test floor, best return on investment and lowest cost of test are achieved. With its favorable cost structure the MT9510 high voltage solution also meets the targets of more cost-sensitive applications in the consumer market.

To learn more about the Multitest MT9510, please visit www.multitest.com/MT9510

About Multitest:

Multitest (headquartered in Rosenheim, Germany) is one of the world’s leading manufacturers of semiconductor material handling equipment and interfaces for the testing and calibration of semiconductors and sensors. Multitest markets a broad portfolio of innovative and performance driven test handlers, contactors and ATE printed circuit boards. Multitest has more than 30 years of experience in the semiconductor industry, providing solutions to the automotive, consumer, communication, and sensor markets. Multitest is a company of Xcerra™ Corporation, which provides capital equipment, interface products, and services to the semiconductor, industrial, and electronics manufacturing industries. Xcerra Corporation offers a comprehensive portfolio of solutions and technologies, and a global network of strategically deployed applications and support resources. Additional information can be found at www.multitest.com and www.Xcerra.com

Reliable Probes for Most Challenging High Current Testing

Everett Charles Technologies Introduces HC500F High Current Probe

Everett Charles Technologies (ECT) introduces the latest addition to our versatile family of high current probes; the HC500F. The HC500F is rated at 150 Amps DC and is designed for the most challenging applications in a broad range of industrial test applications including transportation, automotive, power grid, military and PCB test.

The HC500 enhances the ECT high current spring probe line. The extensive ECT high current probe offering now comprises 8 different continuous current ratings – starting at 10 Amps and peaking at 150 Amps. All ECT high current probes are optimized to meet the dedicated needs of high current applications. Tip styles have been developed to maximize surface contact and reduce arcing. Body geometries and materials have been defined to minimize resistance. ECT high current probes ensure reliable and repeatable testing up to 150 Amps and support extended test times.

Tony DeRosa, Product Manager confirms:”Our probes are designed to address the critical parameters of high current testing: low resistance plungers, optimized base materials and plating, high temperature spring design, and high current tip geometry. Building on ECT’s experience in probe design and fabrication, we’re able to offer these rugged and reliable solutions for high volume production and engineering characterization testing.”

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